Lake Forest, CA, United States of America

David E Methe


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 1989

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1 patent (USPTO):Explore Patents

Title: The Innovations of David E Methe

Introduction

David E Methe is a notable inventor based in Lake Forest, California. He has made significant contributions to the field of measurement technology, particularly with his innovative ultrasonic thickness gauge. His work has paved the way for advancements in the automatic recognition of transducers, enhancing the performance of measurement systems.

Latest Patents

David E Methe holds a patent for an "Ultrasonic thickness gauge having automatic transducer recognition." This measurement system employs a method and apparatus for uniquely tagging each of a plurality of transducers. It automatically recognizes the tag for identifying the transducer and adjusts electronic parameters of the system to enhance performance with the selected transducer. In a preferred embodiment, a resistor is inserted in a piezoelectric transducer of the ultrasonic thickness gauge. A current source and an A to D converter measure the resistor, while a microprocessor-based logic system adjusts the measurement parameters of the gauge to be automatically optimized for the associated transducer characteristics. He has 1 patent to his name.

Career Highlights

David E Methe is associated with NDT Instruments, Inc., where he continues to innovate and develop advanced measurement technologies. His work has been instrumental in improving the accuracy and efficiency of ultrasonic measurement systems.

Collaborations

Some of his notable coworkers include Ronald J Botsco and Robert L Jones, who have collaborated with him on various projects within the field.

Conclusion

David E Methe's contributions to ultrasonic measurement technology demonstrate his commitment to innovation and excellence. His patent reflects a significant advancement in the field, showcasing his expertise and dedication to improving measurement systems.

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