The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 20, 1989

Filed:

Jun. 27, 1988
Applicant:
Inventors:

Ronald J Botsco, Huntington Beach, CA (US);

Robert L Jones, Anaheim, CA (US);

David E Methe, Lake Forest, CA (US);

Assignee:

NDT Instruments, Inc., Huntington Beach, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73597 ; 73620 ;
Abstract

A measurement system employs a method and apparatus for uniquely tagging each of a plurality of transducers, automatically recognizing the tag for identifying the transducer and automatically adjusting electronic parameters of the system for enhancing performance with a selected transducer. In a preferred embodiment, a resistor is inserted in a piezoelectric transducer of an ultrasonic thickness gauge, a current source and A to D converter measure the resistor and a microprocessor-based logic system adjusts measurement parameters of the gauge to be automatically optimized for the associated transducer characteristics.


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