Lexington, MA, United States of America

David E Lees

This inventor holds 2 USPTO granted patents. Top assignee: Honeywell G.m.b.h.. Active years: 1983-1987.


% Patents Active = 100.0

Average Co-Inventor Count = 1.3

ph-index = 2

Forward Citations = 52(Granted Patents)


Company Filing History:


Years Active: 1983-1987

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2 patents (USPTO):Explore Patents

Title: David E Lees: Innovator in Passive Measurement Technologies

Introduction

David E Lees is a notable inventor based in Lexington, MA (US). He has made significant contributions to the field of measurement technologies, holding 2 patents that showcase his innovative spirit and technical expertise.

Latest Patents

One of his latest patents is the "Passive Range Measurement Apparatus and Method." This invention describes a passive range measurement device that includes a camera, onboard motion sensors, image digitizers, and a digital processor. The device creates a digitized image stream from successive images taken by the camera. The digital processor operates on the image stream in conjunction with information obtained from the onboard motion sensors to determine the location of a median plane through the scene. By evaluating hypothetical slices through the scene parallel to the median plane, a topographic range map of the scene may be created, providing a terrain-following capability.

Another significant patent is the "Eye Closure Discrimination System." This system determines whether an eye within a field of view is closed for a predetermined period of time. It distinguishes between reflections from an open eye and any specular reflections within the field of view. The system comprises detection apparatus for viewing the field of view, along with two light sources that help in detecting reflections from both open eyes and specular reflectors. The detection apparatus compares the number of reflections arising from the light sources over a predetermined period to ascertain if the eye was closed.

Career Highlights

David E Lees is currently associated with Honeywell GmbH, where he continues to develop innovative technologies. His work has significantly impacted the fields of imaging and measurement, enhancing the capabilities of various applications.

Collaborations

David collaborates with John Merchant, contributing to the advancement of their projects and innovations.

Conclusion

David E Lees exemplifies the spirit of innovation through his patents and contributions to measurement technologies. His work continues to influence the industry and inspire future advancements.

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