Yvonne, MN, United States of America

David Dickey

This inventor holds 1 USPTO granted patent. Top assignee: Lemhi Ventures Fund II, LP. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David Dickey. Retrieved from https://idiyas.com/inventor/david-dickey-y6fu2fgn

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: David Dickey: Innovator in Coverage Detection Technologies

Introduction

David Dickey is an accomplished inventor based in Yvonne, MN (US). He has made significant contributions to the field of coverage detection technologies. His innovative approach has led to the development of a unique patent that enhances efficiency in risk coverage detection.

Latest Patents

David holds a patent titled "Use Determination Risk Coverage Datastructure for On-Demand and Increased Efficiency Coverage Detection and Rebalancing Apparatuses, Methods and Systems." This patent reflects his expertise in creating systems that improve the accuracy and efficiency of coverage detection processes. He has 1 patent to his name, showcasing his commitment to innovation.

Career Highlights

David is currently associated with Lemhi Ventures Fund II, LP, where he applies his knowledge and skills to advance technological solutions. His work at the company emphasizes the importance of innovative approaches in the financial and risk management sectors.

Collaborations

David collaborates with talented individuals such as Anthony Miller and Matthew Chock. Their combined expertise fosters a creative environment that drives innovation and enhances project outcomes.

Conclusion

David Dickey is a notable inventor whose work in coverage detection technologies has made a significant impact. His patent and career at Lemhi Ventures Fund II, LP highlight his dedication to advancing the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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