David Delaney McGann

Title: Innovations of David Delaney McGann

Introduction

David Delaney McGann is an accomplished inventor based in Penfield, NY (US). He has made significant contributions to the field of signal processing and statistical learning methods. With a total of two patents to his name, McGann's work focuses on enhancing the accuracy of parameter estimates in various applications.

Latest Patents

One of McGann's latest patents involves using statistical learning methods to fuse parameter estimates. This innovative process includes obtaining a set of data points representing estimates of a given parameter, such as the angle of arrival of a target signal. The method employs a computer to process these data points with an unsupervised clustering algorithm, ultimately leading to a preferred estimate of the parameter.

Another notable patent by McGann is centered on determining the angle of arrival of a target signal received by an array of antenna elements. In this system, a pair of receivers simultaneously captures observations of a target signal from multiple elements of the antenna array. A computer processes these samples to determine a maximum likelihood estimation (MLE) of the angle of arrival of the target signal, utilizing advanced algorithms to enhance accuracy.

Career Highlights

David Delaney McGann is currently employed at L-3 Services, Inc., where he applies his expertise in signal processing and statistical methods. His work has contributed to advancements in technology that rely on precise signal detection and analysis.

Collaborations

McGann collaborates with James Covosso Francis, leveraging their combined knowledge and skills to drive innovation in their projects.

Conclusion

David Delaney McGann is a notable inventor whose work in statistical learning and signal processing has led to valuable patents. His contributions continue to influence advancements in technology and signal analysis.