Indian Trail, NC, United States of America

David Deese

USPTO Granted Patents = 1 


 

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: David Deese - Innovator in Moisture and Volatiles Analysis

Introduction

David Deese is an accomplished inventor based in Indian Trail, NC (US). He has made significant contributions to the field of moisture and volatiles analysis through his innovative patent. His work focuses on developing instruments that enhance the accuracy and efficiency of volatile content analysis.

Latest Patents

David Deese holds a patent for a Moisture and Volatiles Analyzer. This instrument includes a cavity and a microwave source designed to produce and direct microwaves into the cavity at frequencies other than infrared frequencies. The device features a balance with at least the balance pan located within the cavity. Additionally, an infrared source is positioned to direct infrared radiation into the cavity at frequencies distinct from those produced by the microwave source. A lens is strategically placed between the infrared source and the balance pan to efficiently direct infrared radiation to a sample on the balance pan. The lens is designed to prevent microwaves from escaping the cavity, ensuring precise measurements.

Career Highlights

David Deese is associated with Cem Corporation, where he applies his expertise in developing advanced analytical instruments. His innovative approach has positioned him as a key figure in the field of moisture and volatiles analysis.

Collaborations

David has collaborated with notable colleagues, including Joseph Joshua Lambert and William Edward Jennings. Their combined efforts contribute to the advancement of technology in their respective fields.

Conclusion

David Deese's contributions to moisture and volatiles analysis through his innovative patent demonstrate his commitment to enhancing analytical technology. His work continues to influence the industry and improve measurement accuracy.

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