Bat Yam, Israel

David Dedi Arev

This inventor holds 1 USPTO granted patent, plus 1 CIPO patent. Top assignee: Trax Technology Solutions Pte Ltd.. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David Dedi Arev. Retrieved from https://idiyas.com/inventor/david-dedi-arev

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: David Dedi Arev: Innovator in Image Sensor Deployment

Introduction

David Dedi Arev is a notable inventor based in Bat Yam, Israel. He has made significant contributions to the field of image sensor technology. His innovative approach focuses on enhancing the deployment of image sensors in retail environments.

Latest Patents

David Dedi Arev holds a patent for a method, medium, and system for planning image sensor deployment. This patent outlines a method for determining the optimal placement of image sensors by analyzing various parameters related to store shelves and product types. The method includes accessing a database to gather information about product heights and coverage parameters, ultimately providing users with valuable insights for camera positioning.

Career Highlights

David is currently associated with Trax Technology Solutions Pte Ltd., where he applies his expertise in image sensor technology. His work at Trax focuses on developing solutions that improve retail operations through advanced imaging techniques.

Collaborations

David has collaborated with notable colleagues, including Youval Bronicki and Odi Paneth. These partnerships have contributed to the advancement of innovative technologies in the retail sector.

Conclusion

David Dedi Arev's contributions to image sensor deployment reflect his commitment to innovation in technology. His work continues to influence the retail industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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