Brugge, Belgium

David De Roest


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 30(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: David De Roest: Innovator in Electromagnetic Shielding Technologies

Introduction

David De Roest is a notable inventor based in Brugge, Belgium. He has made significant contributions to the field of microelectronics, particularly in the area of electromagnetic shielding. His innovative work has led to the development of a patented method that enhances the performance of interconnects in electronic devices.

Latest Patents

David De Roest holds a patent for a "Method of fabrication and device for electromagnetic-shielding structures in a damascene-based interconnect scheme." This patent describes a shielded interconnect and a method of manufacturing it using damascene back-end-of-line technology. The invention focuses on forming electromagnetically shielded interconnects by utilizing standard metallization as a core layer in a coaxial interconnect line. Prior to filling the via and trench openings in the damascene stack, conductive and dielectric layers are created to serve as shield and insulator layers, respectively.

Career Highlights

David is currently associated with the Interuniversitair Microelektronica Centrum, commonly known as imec. His work at imec involves cutting-edge research in microelectronics, where he applies his expertise to develop advanced technologies that address the challenges of modern electronic systems.

Collaborations

David collaborates with esteemed colleagues such as Michele Stucchi and Karen Irma Maex. Their combined efforts contribute to the advancement of research and innovation in the field of microelectronics.

Conclusion

David De Roest is a prominent figure in the realm of electromagnetic shielding technologies. His patented innovations and collaborative work at imec highlight his commitment to advancing microelectronics. His contributions are paving the way for improved electronic device performance and reliability.

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