David D Gutierrez is a notable inventor based in Woodinville, WA (US). He has made significant contributions to the field of software trace analysis, holding 2 patents that enhance the understanding and management of runtime information in computing systems.

Latest Patents

Gutierrez's latest patents include innovative methods and systems for correlating trace events. His first patent focuses on correlating trace events to facilitate analysis based on their relationships. This involves maintaining relationship information within a correlation identifier stack, which marks the occurrence of logical operations during software execution. The generated trace event includes both the correlation identifier stack and an initial event payload, allowing for detailed analysis of the software's runtime behavior. The second patent outlines a method for collecting runtime information for applications, which includes locating trace statements in the source code, collecting relevant information, and outputting it for user utilization.

Career Highlights

David D Gutierrez is currently employed at Microsoft Technology Licensing, LLC, where he applies his expertise in software development and analysis. His work has contributed to advancements in how software performance is monitored and improved.

Collaborations

Throughout his career, Gutierrez has collaborated with notable colleagues such as Scott David Guthrie and Krzysztof J Cwalina, further enhancing the impact of his innovations in the tech industry.

Conclusion

David D Gutierrez stands out as an influential inventor in the realm of software trace analysis, with his patents paving the way for improved software performance monitoring. His contributions continue to shape the future of computing systems.