Lawrence, KS, United States of America

David C Nall

This inventor holds 1 USPTO granted patent. Top assignee: Relm Communications, Inc.. Active years: 1995.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David C Nall. Retrieved from https://idiyas.com/inventor/david-c-nall-cmj86pqf

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 1995

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1 patent (USPTO):Explore Patents

Title: The Innovations of David C. Nall

Introduction

David C. Nall is an accomplished inventor based in Lawrence, Kansas. He has made significant contributions to the field of technology, particularly in the area of frame detection. His innovative work has led to the development of a unique patent that addresses challenges in noisy environments.

Latest Patents

David C. Nall holds a patent for a Partial Frame Detector. This invention provides detection of a frame synchronization pattern in environments characterized by burst noise that typically hinders detection through correlation methods. The patent describes a frame synchronization pattern capable of sustaining a minimum of 17 bits clustered in error, along with random errors, while still ensuring effective frame detection. This is achieved by utilizing a 64-bit Barker derived frame synchronization pattern, complemented by an additional process included in a correlation algorithm.

Career Highlights

David is currently associated with Relm Communications, Inc., where he applies his expertise in developing advanced communication technologies. His work at the company reflects his commitment to innovation and excellence in the field.

Conclusion

David C. Nall's contributions to technology through his patent and work at Relm Communications, Inc. highlight his role as a significant inventor in the industry. His innovative solutions continue to pave the way for advancements in frame detection technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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