This inventor holds 1 USPTO granted patent. Top assignee: Paradigm Research LLC. Active years: 1999.
Company Filing History:
Years Active: 1999
Title: David C McNertney: Innovator in Seedlot Vigor Measurement
Introduction
David C McNertney is an accomplished inventor based in South Haven, MN (US). He has made significant contributions to the field of agricultural technology, particularly in the measurement of seedlot vigor. His innovative approach combines machine vision with analytical techniques to enhance agricultural practices.
Latest Patents
David holds a patent for a "System and method for measuring seedlot vigor." This invention features a machine vision system designed to determine the vigor of seedlots by analyzing images of germinating seeds. The system includes an imaging device that captures images of the seeds and an image analyzer that assesses the growth rate of the seed's root. This technology allows for the determination of seedlot vigor independent of environmental germination conditions. It measures parameters that correlate highly with the desired characteristics and employs a robust experimental design to ensure accurate results.
Career Highlights
David is associated with Paradigm Research LLC, where he applies his expertise in agricultural technology. His work focuses on developing innovative solutions that improve seed quality and agricultural productivity. His patent reflects his commitment to advancing the field and providing farmers with reliable tools for assessing seed performance.
Conclusion
David C McNertney's contributions to the measurement of seedlot vigor exemplify the intersection of technology and agriculture. His innovative patent serves as a valuable resource for enhancing agricultural practices and ensuring better crop yields.