Port Matilda, PA, United States of America

David C James

This inventor holds 1 USPTO granted patent. Top assignee: Raytheon Company. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David C James. Retrieved from https://idiyas.com/inventor/david-c-james-2a6cpm0l

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Innovations of David C James

Introduction

David C James is an accomplished inventor based in Port Matilda, PA (US). He has made significant contributions to the field of acoustic event detection. His innovative work has led to the development of methods and apparatus that enhance the identification of various acoustic events.

Latest Patents

David holds 1 patent for his invention titled "Methods and apparatus for acoustic event detection." This patent focuses on utilizing Mel Frequency Cepstral Coefficients (MFCCs) to process received sound. The technology aims to locate a peak for comparison with a stored event, determining if the peak corresponds to a specific acoustic event.

Career Highlights

David is currently employed at Raytheon Company, where he applies his expertise in acoustic technologies. His work at Raytheon has allowed him to further develop his innovative ideas and contribute to advanced research in the field.

Collaborations

Throughout his career, David has collaborated with notable colleagues, including Brady R Bickel and Robert J Cole. These partnerships have fostered a creative environment that encourages the exchange of ideas and advancements in technology.

Conclusion

David C James is a notable inventor whose work in acoustic event detection has made a significant impact. His innovative methods and collaboration with esteemed colleagues continue to drive advancements in this important field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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