David C Engelhardt

Title: David C Engelhardt: Innovator in Semiconductor Technology

Introduction

David C Engelhardt is a notable inventor based in Minneapolis, MN (US). He has made significant contributions to the field of semiconductor technology, particularly through his innovative patent that addresses the monitoring of carrier lifetime in fabricated semiconductor samples.

Latest Patents

Engelhardt holds a patent for a non-destructive method and apparatus for monitoring carrier lifetime. This method allows for the assessment of the carrier lifetime characteristic of a semiconductor sample during its fabrication process. The technique involves depositing selected materials on a planar surface of a wafer substrate within a fabrication chamber. By utilizing viewports in the chamber walls, the process avoids any alteration to the ongoing fabrication. A focused electromagnetic wave is generated externally and directed through a viewport to interact with the wafer substrate. The reflected electromagnetic wave is then detected, providing valuable data on the carrier lifetime characteristic of the semiconductor sample.

Career Highlights

Throughout his career, Engelhardt has demonstrated a commitment to advancing semiconductor technology. His innovative approach to monitoring carrier lifetime has the potential to enhance the efficiency and effectiveness of semiconductor fabrication processes. With a patent count of 1 patent, Engelhardt's work exemplifies the intersection of creativity and technical expertise in the field.

Collaborations

Engelhardt has collaborated with fellow inventor Vladimir Sokolov, contributing to the development of advanced technologies in the semiconductor industry.

Conclusion

David C Engelhardt's contributions to semiconductor technology through his innovative patent highlight his role as a key inventor in the field. His work not only advances the understanding of semiconductor fabrication but also paves the way for future innovations.