This inventor holds 1 USPTO granted patent. Top assignee: Bio-Imaging Research, Inc.. Active years: 2003.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2003
Title: David C Camp: Innovator in Waste Inspection Technology
Introduction
David C Camp is a notable inventor based in Danville, California. He has made significant contributions to the field of waste management through his innovative patent. His work focuses on improving the methods used for inspecting and assaying waste containers, particularly in relation to radioactivity.
Latest Patents
David C Camp holds a patent for a method and apparatus titled "Waste Inspection Tomography and Non-Destructive Assay." This invention provides a systematic approach to assaying waste containers. The method involves forming multiple slices through the volume of a waste container and conducting a fast passive prescan to measure the radioactivity levels of each slice. It identifies slices with high radioactivity and performs further scans to quantify the source of the radioactivity by weight.
Career Highlights
David C Camp has established himself as a key figure in the field of bio-imaging and waste management. He is associated with Bio-Imaging Research, Inc., where he applies his expertise to develop advanced technologies for waste inspection. His innovative approach has the potential to enhance safety and efficiency in waste management practices.
Collaborations
David C Camp has worked alongside notable colleagues, including David T Nisius and George P Roberson. Their collaborative efforts contribute to the advancement of technologies in the field of bio-imaging and waste inspection.
Conclusion
David C Camp's contributions to waste inspection technology exemplify the importance of innovation in ensuring safety and efficiency in waste management. His patent reflects a commitment to advancing methods that address critical environmental challenges.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile