Gilbert, AZ, United States of America

David Brady

This inventor holds 2 USPTO granted patents and 1 EPO patent. Top assignees: Oem Group, LLC, Shellback Semiconductor Technology, LLC. Active years: 2020-2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David Brady. Retrieved from https://idiyas.com/inventor/david-brady-iip0mc8s

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2020-2023

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2 patents (USPTO):Explore Patents

Title: David Brady: Innovator in Spray Measurement Technology

Introduction

David Brady is an accomplished inventor based in Gilbert, AZ (US). He has made significant contributions to the field of spray measurement technology, holding 2 patents that showcase his innovative approach to solving complex problems in this area.

Latest Patents

Brady's latest patents include systems and methods for a spray measurement apparatus. These patents describe various embodiments of a spray measurement system that features a jig device. This device allows for the measurement of spray output from one or more spray nozzles and helps determine the spray distribution patterns of these nozzles.

Career Highlights

Throughout his career, David Brady has worked with notable companies such as Shellback Semiconductor Technology, LLC and Oem Group, LLC. His experience in these organizations has contributed to his expertise in the field of spray measurement technology.

Collaborations

Some of his coworkers include Darren O O'Reilly and Christian K Forgey. Their collaboration has likely played a role in advancing the projects they have worked on together.

Conclusion

David Brady's innovative work in spray measurement technology and his contributions to the field through his patents highlight his role as a significant inventor. His career reflects a commitment to advancing technology in practical applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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