This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Natural Environment Research Council. Active years: 2009.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2009
Title: Innovations by David Beamish
Introduction
David Beamish is an accomplished inventor based in Edwalton, GB. He has made significant contributions to the field of resistivity measurement, particularly in applications related to subsurface materials. His innovative work has implications for both engineered and non-engineered surfaces.
Latest Patents
David Beamish holds a patent for "Systems and methods for resistivity measurement." This patent discloses a measurement system designed to measure subsurface resistivity. The system is applicable to various surfaces, including engineered surfaces like roads and dams, as well as non-engineered surfaces such as greenfield sites. Additionally, the measurement system can be utilized on biological materials. It features signal input electrodes that input an input signal into subsurface material through capacitive coupling. Pairs of signal detection electrodes are employed to detect a signal caused by the input signal in the subsurface material. A phase-sensitive meter, such as a lock-in amplifier, is included to measure the amplitude and phase of the detectable signal.
Career Highlights
David Beamish is associated with the Natural Environment Research Council, where he has contributed to various research initiatives. His work focuses on advancing measurement techniques that enhance our understanding of subsurface properties.
Collaborations
Some of his notable coworkers include Richard D Ogilvy and Philip I Meldrum, who have collaborated with him on various projects.
Conclusion
David Beamish's innovative contributions to resistivity measurement demonstrate his commitment to advancing scientific understanding in this field. His work continues to influence both research and practical applications in subsurface analysis.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile