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For the Inventor, By the Inventor

Santa Fe, NM, United States of America

David Bastable

This inventor holds 8 USPTO granted patents and 2 published patent applications. Top assignee: Nanodx, Inc.. Active years: 2021-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David Bastable. Retrieved from https://idiyas.com/inventor/david-bastable

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 8 

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 3

Forward Citations = 21(Granted Patents)


Company Filing History:

goldMedal8 out of 9 
 
Nanodx, Inc.
 patents

Years Active: 2021-2025

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8 patents (USPTO):Explore Patents
1. 12360069 - Sensor system and methods of making (2025-07-15),
2. 11808722 - Sensor system and electrodes (2023-11-07),
3. 11761917 - Sensor system and methods (2023-09-19),
4. 11609198 - Sensor system and methods of making (2023-03-21),
5. 11493466 - Sensor system and electrodes (2022-11-08),
6. 11486842 - Sensor system and electrodes (2022-11-01),
7. 11255805 - Sensor system and methods (2022-02-22),
8. 11054384 - Sensor system and methods of making (2021-07-06),

Title: Top Inventor in Santa Fe, NM

Introduction

James R. Kraemer is a prominent inventor based in Santa Fe, New Mexico. His contributions to the field of innovation have garnered attention and respect within the industry.

Latest Patents

James R. Kraemer has recently been awarded several patents that showcase his inventive prowess and commitment to advancing technology.

Career Highlights

Throughout his career, Kraemer has achieved significant milestones, establishing himself as a leader in his field.

Collaborations

Kraemer has collaborated with various organizations and individuals, enhancing his work and expanding the impact of his inventions.

Conclusion

James R. Kraemer continues to be a driving force in innovation, inspiring future generations of inventors.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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