Company Filing History:
3 out of 13,713 
2 out of 535 
1 out of 7 Years Active: 1997-2010
Title: The Innovations of David Alumot
Introduction
David Alumot is a notable inventor based in Rehovot, Israel. He has made significant contributions to the field of optical inspection technology, holding a total of six patents. His work primarily focuses on methods and apparatuses for detecting defects in substrates, such as chips and wafers.
Latest Patents
Among his latest patents is the "Optical Inspection Apparatus for Substrate Defect Detection." This invention outlines a method for inspecting the surface of articles at high speed and low spatial resolution, followed by a detailed examination of suspected defect locations at high spatial resolution. Another significant patent is the "Optical Inspection Method for Substrate Defect Detection," which shares a similar approach to defect detection, emphasizing efficiency and precision in the inspection process.
Career Highlights
David has worked with prominent companies in the industry, including Applied Materials, Inc. and Applied Materials Israel Limited. His experience in these organizations has allowed him to refine his skills and contribute to advancements in optical inspection technologies.
Collaborations
Throughout his career, David has collaborated with talented individuals such as Gad Neumann and Rivka Sherman. These partnerships have fostered innovation and have been instrumental in the development of his patented technologies.
Conclusion
David Alumot's contributions to optical inspection technology demonstrate his expertise and commitment to innovation. His patents reflect a deep understanding of the challenges in substrate defect detection and offer solutions that enhance the efficiency of the inspection process.