David Allen Grewell

Ames, IA, United States of America

David Allen Grewell

This inventor holds 7 USPTO granted patents and 2 published patent applications, plus 1 CIPO patent and 2 EPO patents. Top assignees: Iowa State University Research Foundation Inc., Textron Innovations Inc., Kent Corporation. Active years: 2011-2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David Allen Grewell. Retrieved from https://idiyas.com/inventor/david-allen-grewell

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 7 

% Patents Active = 71.4


 

Average Co-Inventor Count = 2.4

ph-index = 3

Forward Citations = 18(Granted Patents)


Company Filing History:


Years Active: 2011-2022

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7 patents (USPTO):Explore Patents

Title: The Innovative Journey of David Allen Grewell

Introduction: David Allen Grewell is a renowned inventor based in Ames, IA (US) known for his groundbreaking contributions to the field of materials science and engineering.

Latest Patents: David Allen Grewell holds several patents related to advanced composite materials and sustainable manufacturing processes, showcasing his commitment to innovation and environmental sustainability.

Career Highlights: With a distinguished career spanning over two decades, David Allen Grewell has held key positions in research institutions and universities, leading cutting-edge projects in the development of next-generation materials.

Collaborations: Throughout his career, David Allen Grewell has collaborated with leading companies, research institutions, and fellow inventors to push the boundaries of materials science and bring revolutionary ideas to life.

Conclusion: David Allen Grewell's passion for innovation and his relentless pursuit of excellence have solidified his reputation as a visionary inventor in the field of materials science, inspiring the next generation of inventors to think beyond boundaries.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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