This inventor holds 2 USPTO granted patents. Top assignee: Cypress Semiconductor Corporation. Active years: 2000-2003.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2000-2003
Title: Innovations by David A. Crow
Introduction
David A. Crow is an accomplished inventor based in Eagan, MN (US). He has made significant contributions to the field of integrated circuits, particularly in the area of defect monitoring during the manufacturing process. With a total of 2 patents to his name, Crow's work has had a notable impact on the semiconductor industry.
Latest Patents
David A. Crow's latest patents include innovative methods for monitoring defects in the formation of contact holes, vias, and trenches in integrated circuits. His patents detail a process that involves forming a sacrificial topology on a substrate, which duplicates a portion of the device's structure while using a material that is free of elemental silicon. This method allows for easier etching and removal of the sacrificial material compared to traditional polysilicon. The etching process creates detectable indentations in the substrate, which can be inspected using wafer surface inspection tools. This ensures that the actual devices formed will have properly created contact holes, vias, and trenches.
Career Highlights
David A. Crow is currently employed at Cypress Semiconductor Corporation, where he continues to innovate in the field of semiconductor manufacturing. His expertise in defect monitoring and process optimization has made him a valuable asset to the company.
Collaborations
Some of his notable coworkers include Edward M. Shamble and Thomas Boonstra, who have collaborated with Crow on various projects within the semiconductor industry.
Conclusion
David A. Crow's contributions to the field of integrated circuits through his innovative patents and work at Cypress Semiconductor Corporation highlight his importance as an inventor. His methods for monitoring defects are paving the way for advancements in semiconductor manufacturing.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile