Fremont, CA, United States of America

Date Jw Noorlag

This inventor holds 1 USPTO granted patent. Top assignee: Apple Inc.. Active years: 2025.


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Innovations by Date Jw Noorlag

Introduction

Date Jw Noorlag is an accomplished inventor based in Fremont, CA (US). He has made significant contributions to the field of integrated circuits, particularly in the area of defect detection. His innovative work has led to the development of a patented technology that addresses critical issues in silicon wafer processing.

Latest Patents

Date holds a patent for "Systems and methods for silicon crack detection structure." This patent focuses on detecting defects caused by cracks in integrated circuits, which can occur during or after the singulation of silicon wafers. The integrated circuit includes crack detection circuitry that features a metal circuit. If a crack occurs, the metal circuit may fracture, allowing for the detection of the defect. This technology not only identifies cracks but also ensures the accurate operation of the circuitry within the integrated circuit. Date has 1 patent to his name.

Career Highlights

Date Jw Noorlag is currently employed at Apple Inc., where he continues to innovate and contribute to advancements in technology. His work at Apple has positioned him as a key player in the development of cutting-edge integrated circuit solutions.

Collaborations

Some of Date's notable coworkers include Vasu P Ganti and Scott D Hector. Their collaboration fosters a creative environment that enhances the potential for groundbreaking innovations.

Conclusion

Date Jw Noorlag's contributions to the field of integrated circuits through his patented technology exemplify the importance of innovation in technology. His work not only addresses existing challenges but also paves the way for future advancements in the industry.

Profile summary based on public USPTO records.
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