Bengaluru, India

Darshan Raj

This inventor holds 1 USPTO granted patent. Top assignee: Honeywell International Inc.. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Darshan Raj. Retrieved from https://idiyas.com/inventor/darshan-raj

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 12.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: The Innovative Mind of Darshan Raj

Introduction

Darshan Raj is a notable inventor based in Bengaluru, India. He has made significant contributions to the field of non-volatile memory devices. His innovative approach has led to the development of a unique system designed to enhance data integrity and reliability.

Latest Patents

Darshan Raj holds a patent for a "System and method for detection and prevention of flash corruption." This invention involves a non-volatile memory device that includes an application code sector capable of storing two copies of application code. The device features a boot sector with a boot loader code that checks the integrity of both copies. If one copy is found to be corrupted, the device automatically overwrites it with the other copy, ensuring data reliability.

Career Highlights

Darshan Raj is currently employed at Honeywell International Inc., where he continues to innovate and contribute to advancements in technology. His work focuses on improving memory device functionality and reliability, which is crucial in today's data-driven world.

Collaborations

Some of his coworkers include Yogesha Aralakuppe Ramegowda and Srinivasa Rao Dangeti. Their collaborative efforts contribute to the innovative environment at Honeywell International Inc.

Conclusion

Darshan Raj's contributions to the field of non-volatile memory devices exemplify the spirit of innovation. His patent reflects a commitment to enhancing data integrity, making a significant impact in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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