Boxborough, MA, United States of America

Darryl Jc Pappin

This inventor holds 1 USPTO granted patent and 3 published patent applications, plus 2 CIPO patents. Top assignee: Dh Technologies Development Pte. Ltd.. Active years: 2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Darryl Jc Pappin. Retrieved from https://idiyas.com/inventor/darryl-jc-pappin

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2011

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1 patent (USPTO):Explore Patents

Title: Darryl Jc Pappin: Innovator in Spectral Analysis

Introduction

Darryl Jc Pappin is a notable inventor based in Boxborough, MA (US). He has made significant contributions to the field of spectral analysis, particularly through his innovative patent.

Latest Patents

Darryl holds a patent titled "Method and apparatus for de-convoluting a convoluted spectrum." This invention relates to methods, systems, and apparatus suitable for performing a survey scan of one or more analytes or labeled fragments of analytes. The goal is to obtain a convoluted spectrum and to de-convolute it using a mass spectrometer and associated processing system. He has 1 patent to his name.

Career Highlights

Darryl is currently associated with Dh Technologies Development Pte. Ltd., where he continues to work on advancements in his field. His expertise in spectral analysis has positioned him as a valuable asset in the industry.

Collaborations

Darryl has collaborated with talented individuals such as Nikita Khainovski and Darryl S Spencer, contributing to various projects and innovations.

Conclusion

Darryl Jc Pappin's work in spectral analysis exemplifies the impact of innovative thinking in scientific research. His contributions continue to influence the field and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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