Huntington Beach, CA, United States of America

Darren Rf Schurig

This inventor holds 1 USPTO granted patent. Top assignee: Sensormetrix. Active years: 2025.


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Darren Rf Schurig

Introduction

Darren Rf Schurig is a notable inventor based in Huntington Beach, CA (US). He has made significant contributions to the field of ballistic detection systems. His innovative work focuses on enhancing the accuracy and efficiency of projectile detection and analysis.

Latest Patents

Darren holds a patent for a groundbreaking invention titled "Camera and projectile detector systems and devices for ballistic parameter measurements of a projectile in a target volume." This ballistic detection system integrates a projectile detector, electromagnetic radiation detection equipment, and a ballistics analysis computer. The system is designed to capture image data from multiple cameras, analyze the trajectory of projectiles, and determine their points of intersection with objects in a target volume.

Career Highlights

Darren is currently associated with Sensormetrix, where he continues to develop innovative technologies. His work has garnered attention for its potential applications in various fields, including defense and security. With a focus on precision and reliability, Darren's inventions aim to improve the safety and effectiveness of ballistic measurements.

Collaborations

Darren has collaborated with talented individuals such as Anthony F Starr and Tatiana N Starr. Their combined expertise contributes to the advancement of technologies in the field of ballistic detection.

Conclusion

Darren Rf Schurig's contributions to the field of ballistic detection systems exemplify the spirit of innovation. His patent and ongoing work at Sensormetrix highlight the importance of advancements in technology for enhancing safety and accuracy in projectile analysis.

Profile summary based on public USPTO records.
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