Wichita, KS, United States of America

Darrell W Woelk

This inventor holds 1 USPTO granted patent. Top assignee: Ncr Corporation. Active years: 1983.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Darrell W Woelk. Retrieved from https://idiyas.com/inventor/darrell-w-woelk

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 1983

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1 patent (USPTO):Explore Patents

Title: Darrell W. Woelk: Inventor of an Associative Memory System.

Introduction

Darrell W. Woelk is an inventor associated with Wichita, Kansas, and NCR Corporation. His patent work includes an associative memory system designed to process data through parallel operations.

Latest Patents

Woelk is credited with 1 patent, titled “Associative Memory System.” The invention describes multiple associative data controllers operating in parallel, each connected to its own storage array. A primitive function processor links the controllers to a control unit and issues hardware instructions that coordinate their operations. The controllers support simultaneous read and write operations, as well as tagging, minimum and maximum comparisons, and logical operations.

Career Highlights

Woelk’s documented patent contribution focuses on associative memory architecture and parallel processing. The system’s design brings data storage and processing functions together to support user access through a control unit.

Collaborations

Marvin R. DeForest and John W. Stewart are identified as Woelk’s coworkers. The available information does not specify their roles in developing the patent.

Conclusion

Darrell W. Woelk’s patent describes a parallel associative memory system that combines specialized data controllers, storage arrays, and processing functions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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