Faber, VA, United States of America

Darrell James Hatfield, Ii

This inventor holds 1 USPTO granted patent. Top assignee: Intelligent Platforms, LLC. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Darrell James Hatfield, Ii. Retrieved from https://idiyas.com/inventor/darrell-james-hatfield-ii

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Darrell James Hatfield II: Inventor in Power-Supply Monitoring.

Introduction

Darrell James Hatfield II is an inventor associated with Faber, Virginia. His patent work concerns monitoring power supplies used with programmable logic controllers (PLCs). The available information lists 1 patent associated with him.

Latest Patents

Hatfield is named on “Methods and Apparatus to Monitor a Power Supply.” The invention describes a first power supply within a PLC that receives input power from a second power supply outside the PLC. Analytics circuitry in the first power supply uses that input power to determine a diagnostic parameter associated with the external power supply. This approach supports monitoring of power-supply conditions in industrial control systems.

Career Highlights

The provided information associates Hatfield with Intelligent Platforms, LLC. His listed patent reflects work on diagnostics for power supplies connected to PLCs, a technology relevant to industrial automation and equipment monitoring.

Collaborations

Hatfield’s listed coworkers include Alan Paul Mathason and Peter Thomas Betker. They are also associated with the patent information provided.

Conclusion

Darrell James Hatfield II’s documented invention focuses on using PLC power-supply circuitry to assess an external supply, highlighting his contribution to industrial power monitoring.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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