Dario Elyasi

Title: Dario Elyasi: Innovator in Optical Metrology

Introduction

Dario Elyasi is a prominent inventor based in Jerusalem, Israel. He has made significant contributions to the field of optical metrology, particularly in the area of in-situ measurements. With a total of 3 patents to his name, Elyasi continues to push the boundaries of innovation in his field.

Latest Patents

One of Dario Elyasi's latest patents focuses on optical metrology for in-situ measurements. This method and system are designed to control processes applied to patterned structures with varying layered stacks. The process involves sequentially receiving measured data that indicates the optical response of the structure during a predetermined processing time. It generates a corresponding sequence of data pieces measured over time. The analysis and processing of this data allow for the determination of at least one main parameter of the structure. The method includes optimizing model data that describes the relationship between the optical response and the parameters of the structure, ultimately generating data indicative of the process applied.

Career Highlights

Dario Elyasi is currently employed at Nova Measuring Instruments Ltd., where he applies his expertise in optical metrology. His work has been instrumental in advancing the technology used in various applications, enhancing the precision and efficiency of measurement processes.

Collaborations

Elyasi has collaborated with notable colleagues, including Igor Turovets and Cornel Bozdog. These partnerships have contributed to the development of innovative solutions in the field of optical metrology.

Conclusion

Dario Elyasi is a key figure in the realm of optical metrology, with a focus on in-situ measurements. His patents and work at Nova Measuring Instruments Ltd. reflect his commitment to innovation and excellence in his field.