Round Rock, TX, United States of America

Darin Duvall

This inventor holds 1 USPTO granted patent. Top assignee: Dell Products Inc.. Active years: 2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Darin Duvall. Retrieved from https://idiyas.com/inventor/darin-duvall

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: The Innovative Mind of Darin Duvall

Introduction: Darin Duvall, an inventor based in Round Rock, TX, has made significant contributions to the field of technology. With his innovative approach and expertise, he has been able to create solutions that enhance user experience, specifically in the realm of printing.

Latest Patents: Duvall holds one notable patent, which is a printer operator panel. This invention showcases his dedication to improving the functionality and usability of printing devices, making them more accessible to users.

Career Highlights: Currently, Duvall is associated with Dell Products Inc., where he applies his inventive skills to drive technological advancement. His work at Dell has allowed him to explore various facets of product development and user interface design.

Collaborations: In his journey as an inventor, Duvall has had the opportunity to collaborate with talented individuals, including Pedro M Alfonso and Kenneth Clair Musgrave. These collaborations have fostered a dynamic environment where innovative ideas can flourish.

Conclusion: Darin Duvall's commitment to innovation and his successful patent highlight the impact of individual inventors in the technology sector. As he continues to work alongside his colleagues at Dell Products Inc., Duvall's contributions are sure to inspire future advancements in printing technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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