Company Filing History:
Years Active: 2025
Title: Daria Negri: Innovator in Metrology Systems
Introduction
Daria Negri is a prominent inventor based in Milpitas, CA (US). She has made significant contributions to the field of metrology systems, particularly with her innovative designs that enhance the efficiency and accuracy of wafer measurements.
Latest Patents
Daria holds a patent for an "Oscillating Secondary Stage for Frame-Mode Overlay Metrology." This invention features an oscillating secondary stage within a metrology system. The primary stage is designed for long movements to transport a wafer from one location to another. The secondary stage, which is coupled to the primary stage, holds the wafer and is configured to oscillate between two directions. This oscillation allows for capturing an image frame of the wafer at a target location while the primary stage is in motion.
Career Highlights
Daria is currently employed at Kla Corporation, where she applies her expertise in metrology systems. Her work focuses on developing advanced technologies that improve the precision of wafer measurements in semiconductor manufacturing.
Collaborations
Daria collaborates with talented individuals such as Izhar Agam and Andrew V. Hill, contributing to a dynamic team that drives innovation in their field.
Conclusion
Daria Negri's contributions to metrology systems exemplify her commitment to innovation and excellence. Her patent and work at Kla Corporation highlight her role as a leading inventor in the industry.