Darell Smith Whitaker

Title: Darell Smith Whitaker: Innovator in Interferometric Imaging

Introduction

Darell Smith Whitaker is a notable inventor based in Essex Junction, Vermont. He has made significant contributions to the field of interferometric imaging, particularly in the detection and analysis of surface defects. His innovative approach has led to the development of a unique patent that enhances the accuracy and efficiency of defect detection.

Latest Patents

Darell Whitaker holds a patent for an "Apparatus and method for storing interferometric images of scanned." This invention utilizes an interferometer to locate and examine defects in a test surface of a specimen. The process involves driving the test surface past the objective of the interferometer at a constant speed while examining a darkfield interferogram. The location of each defect is stored during this examination. Subsequently, the test specimen is moved to specific locations for static measurements using an area array of CCD elements. The phase angle relationship of the interferometer is varied to calculate the heights of surface segments, ensuring accurate height corrections for segments located beyond a quarter wavelength of the interferometer light source.

Career Highlights

Darell Whitaker is associated with the International Business Machines Corporation (IBM), where he has applied his expertise in optical engineering and imaging technologies. His work has contributed to advancements in the field, particularly in enhancing the capabilities of interferometric systems.

Collaborations

Throughout his career, Darell has collaborated with talented individuals such as Akram Aref Bou-Ghannam and Alan David Dorundo. These collaborations have fostered innovation and have led to the development of cutting-edge technologies in the field of imaging.

Conclusion

Darell Smith Whitaker's contributions to interferometric imaging demonstrate his commitment to innovation and excellence. His patent and work at IBM highlight his role as a key figure in advancing technology in defect detection and analysis.