Glendale, AZ, United States of America

Danny R Barnett

This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 1981.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Danny R Barnett. Retrieved from https://idiyas.com/inventor/danny-r-barnett

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 17(Granted Patents)


Company Filing History:

goldMedal1 out of 834,570 
Other
 patents

Years Active: 1981

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1 patent (USPTO):Explore Patents

Title: The Innovations of Danny R Barnett

Introduction

Danny R Barnett is an accomplished inventor based in Glendale, AZ. He has made significant contributions to the field of integrated circuit testing through his innovative designs. His work focuses on enhancing the precision and efficiency of test probe alignment.

Latest Patents

Danny R Barnett holds a patent for a "Test Probe Alignment Apparatus." This invention is designed for the alignment of test probes used in testing integrated circuits. The apparatus features three separate stages, where the theta stage is distinct from the X-Y stage, and the Z stage operates independently from both the theta and X-Y stages. This innovative design allows for improved accuracy in testing processes.

Career Highlights

Throughout his career, Danny has demonstrated a commitment to advancing technology in the field of electronics. His patent reflects his expertise and dedication to solving complex problems in integrated circuit testing. His work has contributed to the development of more reliable electronic devices.

Collaborations

Danny R Barnett has collaborated with John D Spano, working together to enhance their projects and share insights in their field. Their partnership has fostered innovation and creativity in their respective areas of expertise.

Conclusion

Danny R Barnett is a notable inventor whose work in test probe alignment has made a significant impact on the electronics industry. His innovative approach continues to inspire advancements in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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