Kozlów, Poland

Daniol Mateusz

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Aesculap Ag. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Daniol Mateusz. Retrieved from https://idiyas.com/inventor/daniol-mateusz

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Daniol Mateusz and Modular Sterile-Circuit Monitoring

Introduction

Daniol Mateusz is an inventor associated with Kozłów, Poland, and Aesculap AG. His patent work concerns modular technology for detecting and tracking sterile materials during sterilization.

Latest Patents

Mateusz is named on 1 patent: “Modular Detection System for Sterile Circuit Monitoring and Method for Monitoring a Sterile Material Circuit.” The invention describes a system designed to fit into a strainer basket, either directly or on a base plate. Its modular components can include a central electronic unit, slots for material-retaining systems, and antenna systems that read transponders attached to sterile materials. Conductor tracks connect the modules and support monitoring and tracing throughout the sterilization circuit.

Career Highlights

Mateusz’s listed patent reflects work on modular detection and monitoring for sterile-material processing. The system’s configurable components are intended to support different arrangements of retainers and electronic connections.

Collaborations

The supplied information identifies Frederick Lenzenhuber and Stephanie Auber as coworkers. They are associated with the professional context provided for Mateusz, though specific roles in the patent are not stated.

Conclusion

Daniol Mateusz’s patent focuses on a configurable system for monitoring and tracing sterile materials, combining transponder-reading retainers with modular electronic components.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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