San Jose, CA, United States of America

Daniel W Zaide

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Apple Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Daniel W Zaide. Retrieved from https://idiyas.com/inventor/daniel-w-zaide

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Daniel W. Zaide and 3D Map Visualization

Introduction

Daniel W. Zaide is an inventor based in San Jose, California, and is associated with Apple Inc. His work includes techniques for making areas of interest on three-dimensional maps easier to distinguish.

Latest Patents

Zaide is named on one patent, titled “Techniques for Generating and Applying 3D Tint Bands to a Map.” The invention describes overlaying three-dimensional tint band meshes on other map meshes, such as those representing terrain, elevation, and infrastructure. The tint bands can help visually distinguish areas of interest, and their characteristics may be dynamically updated. The techniques can also use mesh connectivity information during overlay operations to improve performance.

Career Highlights

Zaide’s documented patent work focuses on three-dimensional map visualization and efficient mesh overlays. His patent record lists 1 patent.

Collaborations

Zaide’s listed coworker is David Bryson. The patent information provided identifies both inventors in connection with work associated with Apple Inc.

Conclusion

Daniel W. Zaide’s patent highlights an approach to clearer, more efficient three-dimensional map displays through adaptable tint bands and mesh-aware overlay techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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