Forest Lodge, Australia

Daniel Totonjian


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: The Innovative Mind of Daniel Totonjian

Introduction

Daniel Totonjian is an accomplished inventor based in Forest Lodge, Australia. With a keen mind for innovation, he has made significant contributions in the field of microscopy, specifically through his patent for a method and system for plasma-assisted low vacuum charged-particle microscopy. This invention enhances the imaging capabilities under low vacuum conditions, marking a noteworthy achievement in the scientific community.

Latest Patents

Totonjian holds a single patent, titled "Method and system for plasma assisted low vacuum charged-particle microscopy." This method features various approaches for imaging a sample under low vacuum with a charged particle beam. Notably, a magnetic field is introduced within the detection area of the detector while gas and plasma are provided to assist in the detection of charged particles emitted from the sample. The result is a high-quality image formed based on the detected charged particles, showcasing Totonjian's expertise in advanced microscopy techniques.

Career Highlights

Currently, Daniel Totonjian is associated with FEI Company, where he works alongside talented colleagues such as James Bishop and Chris Elbadawi. His role at FEI Company emphasizes his commitment to pushing the boundaries of microscopy and innovative imaging technologies, reinforcing the company's reputation as a leader in the field.

Collaborations

At FEI Company, Totonjian collaborates with fellow professionals like James Bishop and Chris Elbadawi, fostering an innovative environment that encourages the sharing of ideas and expertise. Their combined efforts in research and development contribute to advancing microscopy technologies that benefit various scientific disciplines.

Conclusion

Daniel Totonjian exemplifies the innovative spirit that drives advancements in the field of microscopy. With his patented method for plasma-assisted low vacuum charged-particle microscopy, he demonstrates a deep understanding of imaging technologies that has the potential to transform research methodologies. As he continues to work with his talented colleagues at FEI Company, the impact of his contributions on the scientific community will surely be felt for years to come.

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