Tel Aviv, Israel

Daniel S Seidman

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Aivf Ltd.. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Daniel S Seidman. Retrieved from https://idiyas.com/inventor/daniel-s-seidman-evnzji7m

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: The Innovative Mind of Daniel S. Seidman

Introduction

Daniel S. Seidman is a notable inventor based in Tel Aviv, Israel. He has made significant contributions to the field of image processing through his innovative patent. His work focuses on enhancing the detection of features within images, which has applications in various technological domains.

Latest Patents

Daniel S. Seidman holds a patent for a method and corresponding apparatus for image feature detection. This patent involves determining a plurality of characteristic values for each pixel or group of pixels within an image. Additionally, it includes calculating a confidence value for a target area of the image based on these characteristic values. Each characteristic value pertains to a different aspect of the feature, and the confidence value indicates whether the feature is represented by the target area.

Career Highlights

Seidman is associated with Aivf Ltd., where he applies his expertise in image processing. His work at the company has allowed him to explore and develop advanced technologies that enhance image analysis.

Collaborations

Some of his notable coworkers include Daniella Marder Gilboa and Ron Uriel Maor. Their collaboration contributes to the innovative environment at Aivf Ltd.

Conclusion

Daniel S. Seidman exemplifies the spirit of innovation in the field of image processing. His contributions through his patent demonstrate his commitment to advancing technology and improving image feature detection.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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