Houston, TX, United States of America

Daniel P Jones

This inventor holds 1 USPTO granted patent. Top assignee: Reliability Incorporated. Active years: 1985.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Daniel P Jones. Retrieved from https://idiyas.com/inventor/daniel-p-jones-4ol3verx

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 1985

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1 patent (USPTO):Explore Patents

Title: The Innovations of Daniel P. Jones

Introduction

Daniel P. Jones is an accomplished inventor based in Houston, Texas. He has made significant contributions to the field of electronics, particularly with his innovative patent related to burn-in clock monitoring. His work has implications for improving the reliability of electronic components.

Latest Patents

Daniel P. Jones holds a patent for a "Burn-in Clock Monitor." This invention involves monitoring several clock lines on a burn-in board by diode ANDing the clock lines to one or two monitor lines. The ANDing circuitry is mounted on the burn-in board, and each monitor line connects through the burn-in chamber back wall to a detection circuit. This circuit detects the presence, level, and quality of the signal on the monitor line, providing an indication and sounding an alarm when the desired monitor signal quality is absent.

Career Highlights

Daniel P. Jones is currently employed at Reliability Incorporated, where he applies his expertise in electronics and innovation. His work at the company focuses on enhancing the reliability of electronic systems, which is crucial in various industries.

Collaborations

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Conclusion

Daniel P. Jones exemplifies the spirit of innovation through his contributions to electronic reliability. His patent for the burn-in clock monitor showcases his commitment to improving technology in meaningful ways.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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