Cayuga, TX, United States of America

Daniel Lusk

This inventor holds 1 USPTO granted patent. Top assignee: Texas Instruments Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Daniel Lusk. Retrieved from https://idiyas.com/inventor/daniel-lusk

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Daniel Lusk

Introduction

Daniel Lusk is a notable inventor based in Cayuga, Texas. He has made significant contributions to the field of semiconductor technology. His work focuses on improving the efficiency and organization of chip information.

Latest Patents

Lusk holds a patent for "Methods and apparatus to provide register information of semiconductor chips." This patent describes an apparatus that includes accessing chip information, removing redundant information, and classifying the deduplicated chip information into different access permissions. The process ensures that classified chip information is stored efficiently in memory.

Career Highlights

Daniel Lusk is associated with Texas Instruments Corporation, a leading company in semiconductor design and manufacturing. His role at the company has allowed him to contribute to innovative solutions in the semiconductor industry. Lusk's patent reflects his commitment to advancing technology in this field.

Collaborations

Lusk has worked alongside talented colleagues, including J Paul Austin Carpenter and Kenyan Degles Burnham. Their collaboration has likely fostered an environment of innovation and creativity within their projects.

Conclusion

Daniel Lusk's contributions to semiconductor technology through his patent demonstrate his innovative spirit and dedication to improving chip information management. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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