Sulzfeld, Germany

Daniel Kraeter

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Balluff Gmbh. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Daniel Kraeter. Retrieved from https://idiyas.com/inventor/daniel-kraeter

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Daniel Kraeter and Shaft-Twist Detection Technology.

Introduction

Daniel Kraeter is an inventor based in Sulzfeld, Germany. His patent work includes technology for detecting a shaft’s twist angle and the torque acting on it.

Latest Patents

Kraeter is associated with 1 patent: “Device for Detecting the Twist Angle of a Shaft and/or a Torque Occurring on the Shaft and Methods for Operating the Device.” The invention uses two encoders positioned at a predefined distance from one another, with inductive sensors that scan each encoder. The sensors provide signals corresponding to the shaft’s rotational angles, and a difference ascertainment unit determines the twist angle from the difference between those readings. The device can also detect torque acting on the shaft.

Career Highlights

Kraeter is associated with Balluff GmbH. His patent describes an approach to measuring shaft rotation and twist using encoders and inductive sensing.

Collaborations

Sorin Fericean and Markus Fritton are identified as Kraeter’s coworkers. The available information does not specify their roles in the patent or their particular contributions.

Conclusion

Daniel Kraeter’s recorded patent focuses on detecting shaft twist and torque through paired encoders and inductive sensors, reflecting his association with Balluff GmbH.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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