Circleville, OH, United States of America

Daniel K Owens


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 1987

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Daniel K Owens

Introduction

Daniel K Owens is a notable inventor based in Circleville, OH (US). He has made significant contributions to the field of film inspection technology. His work focuses on enhancing the quality and accuracy of transparent film used in various recording devices.

Latest Patents

Owens holds a patent for a "Method of film inspection with a microscopical image analyzer." This innovative automated system inspects metallized transparent film by utilizing a light source to illuminate the film sample. The transmitted light is analyzed through a microscope connected to a video camera, which produces a videoscan. This videoscan is then digitized and processed by a computer to calculate asperity height distribution. This method is particularly beneficial for ensuring the quality of film used in video tapes, where precise information on asperity height distribution is crucial. He has 1 patent to his name.

Career Highlights

Daniel K Owens is associated with E.I. du Pont de Nemours and Company, a leading organization in the field of materials science and technology. His work at this company has allowed him to develop and refine his innovative methods for film inspection.

Collaborations

Owens has collaborated with notable colleagues, including Peter A Jansson and Michael J Merrill. Their combined expertise has contributed to advancements in film inspection technologies.

Conclusion

Daniel K Owens exemplifies the spirit of innovation in the field of film inspection. His patented method significantly enhances the quality control processes for transparent films used in recording devices. His contributions continue to impact the industry positively.

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