Zurich, Switzerland

Daniel Fürer

This inventor holds 6 USPTO granted patents. Top assignee: Kistler Holding Ag. Active years: 2019-2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Daniel Fürer. Retrieved from https://idiyas.com/inventor/daniel-fürer

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2019-2020

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6 patents (USPTO):Explore Patents

Title: The Innovations of Daniel Fürer

Introduction

Daniel Fürer is a notable inventor based in Zurich, Switzerland. He has made significant contributions to the field of pressure measurement technology. With a total of six patents to his name, Fürer has established himself as a key figure in his industry.

Latest Patents

Among his latest innovations are several advanced pressure measuring devices. One of his patents features a pressure measuring device with a narrow top segment, wide bottom, and chamfered transitions. Another notable invention is a pressure measuring device with extra wide top and bottom segments and straight sides. These patents reflect his commitment to enhancing measurement accuracy and efficiency.

Career Highlights

Daniel Fürer has worked with Kistler Holding AG, a company renowned for its expertise in measurement technology. His experience at Kistler has allowed him to develop and refine his innovative ideas. His work has contributed to the advancement of pressure measurement solutions.

Collaborations

Throughout his career, Fürer has collaborated with talented professionals in his field. Notable coworkers include Christof Sonderegger and Daniel Buerki, who have contributed to various projects alongside him.

Conclusion

Daniel Fürer is a distinguished inventor whose work in pressure measurement technology has led to several important patents. His contributions continue to influence the industry and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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