Umea, Sweden

Daniel Fallman

This inventor holds 1 USPTO granted patent. Top assignee: Abb Research Ltd.. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Daniel Fallman. Retrieved from https://idiyas.com/inventor/daniel-fallman

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2016

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Daniel Fallman and Process-Control Workstation Innovation.

Introduction

Daniel Fallman is an inventor associated with Umeå, Sweden, and ABB Research Ltd. His patent work concerns presenting process-related information to users through a workstation interface.

Latest Patents

The supplied information lists 1 patent for Fallman: “Work station in a process control system.” The invention describes a method for displaying graphical symbols representing process elements and indicating when media data is available for an element. A recording device reads an identifier from a tag on the element and sends the identifier and recorded media data to the process control system. The system compares the identifier with stored element data, identifies the corresponding process element, and indicates which graphical symbol represents it.

Career Highlights

Fallman’s listed patent reflects work on connecting recorded media with identifiable elements in a process-control environment. The approach helps users locate relevant media through the workstation’s graphical display.

Collaborations

The supplied information names Martin Olausson and Bjorn Yttergren as Fallman’s coworkers. The patent is associated with ABB Research Ltd.

Conclusion

Daniel Fallman’s listed invention focuses on making media associated with process elements easier to identify and access through a process-control workstation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…