New York, NY, United States of America

Daniel Casado De Luis

This inventor holds 1 USPTO granted patent. Top assignee: American International Group, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Daniel Casado De Luis. Retrieved from https://idiyas.com/inventor/daniel-casado-de-luis

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Daniel Casado De Luis: Inventor of an Automated Security Detection Assurance System.

Introduction

Daniel Casado De Luis is an inventor based in New York, New York. His patent work addresses automated testing and assurance for security detection systems.

Latest Patents

Casado De Luis is associated with 1 patent: “Automated Security Detection Assurance System with Rule-as-Code Management and Integrated Posture Testing.” The invention describes a computer-implemented system that stores detection rules in code. Each rule includes an injector component for generating simulated security data and a watcher component that specifies expected detection outcomes.

A watchdog manager retrieves the rules, runs the injectors, and monitors a security information and event management (SIEM) system for corresponding detections. It then compares observed results with the expected outcomes. A notification component generates alerts when the results differ, helping identify gaps in security detection.

Career Highlights

Casado De Luis is associated with American International Group, Inc. His patented system focuses on testing whether security monitoring tools detect simulated events as intended.

Collaborations

Panagiotis Moullotou is identified as a coworker. The available information does not specify a direct role for Moullotou in the patent.

Conclusion

Daniel Casado De Luis’s patent presents an automated approach to validating security detections by comparing simulated events with expected SIEM outcomes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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