Company Filing History:
Years Active: 2000-2003
Title: Dan M Bartell: Innovator in Scanned Image Alignment Systems
Introduction
Dan M Bartell is a notable inventor based in San Carlos, CA (US). He has made significant contributions to the field of image processing, particularly in the development of systems and methods for aligning scanned images. With a total of 2 patents to his name, Bartell's work has the potential to enhance various applications in imaging technology.
Latest Patents
Bartell's latest patents focus on scanned image alignment systems and methods. These innovations provide systems and methods for aligning scanned images by incorporating a pattern within the scanned image. When the image is convolved with a filter, a recognizable pattern is generated in the convolved image. This allows the scanned image to be aligned according to the position of the recognizable pattern in the convolved image. Additionally, the filter can remove portions of the scanned image that do not correspond to the pattern, improving the accuracy of the alignment process.
Career Highlights
Dan M Bartell is currently associated with Affymetrix, Inc., where he continues to work on innovative solutions in imaging technology. His expertise in this area has positioned him as a valuable contributor to the company's research and development efforts.
Collaborations
One of Bartell's notable coworkers is Peter J Fiekowsky. Their collaboration may have contributed to the advancements in the technologies they are developing.
Conclusion
Dan M Bartell's work in scanned image alignment systems showcases his innovative spirit and dedication to improving imaging technology. His contributions are likely to have a lasting impact on the field.