Korczyna, Poland

Damian Kuznar

This inventor holds 1 USPTO granted patent. Top assignee: Akademia Gorniczo-Hutnicza Im. Stanislawa Staszica. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Damian Kuznar. Retrieved from https://idiyas.com/inventor/damian-kuznar

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Damian Kuznar and X-Ray Detector Innovation.

Introduction

Damian Kuznar is an inventor associated with Korczyna, Poland, and Akademia Górniczo-Hutnicza im. Stanisława Staszica. His listed patent concerns estimating the amplitude of voltage pulses in pixel readout channels used in hybrid pixel array detectors.

Latest Patents

Kuznar is credited with 1 patent, titled “Circuit and Method for X-Ray Induced Voltage Pulse Amplitude Estimation in Pixel Readout Channel.” The invention describes a circuit that receives a signal from a pixel electrode and uses a charge-sensitive amplifier to convert the resulting current pulse into a voltage pulse. An analog-to-digital converter samples the voltage signal and produces a codeword, while an artificial neural network processes the data to estimate the pulse’s amplitude. The design combines signal amplification, digital sampling, and neural-network computation in a pixel readout channel.

Career Highlights

The available information associates Kuznar’s work with Akademia Górniczo-Hutnicza im. Stanisława Staszica. His patent reflects an application of artificial neural networks to signal processing in X-ray detection.

Collaborations

Kuznar’s listed coworkers include Anna Koziol and Piotr Maj. The available details do not specify their roles in the patent or their particular contributions.

Conclusion

Damian Kuznar’s listed invention brings together electronic signal processing and neural-network estimation to address voltage-pulse measurement in hybrid pixel X-ray detectors.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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