Suwon, South Korea

Dal-jo Lee

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 1999.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dal-jo Lee. Retrieved from https://idiyas.com/inventor/dal-jo-lee-j3e3xrl1

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 1999

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1 patent (USPTO):Explore Patents

Title: Dal-jo Lee: Innovator in Semiconductor Technology

Introduction

Dal-jo Lee is a prominent inventor based in Suwon, South Korea. He is known for his contributions to semiconductor technology, particularly in the field of memory devices. His innovative approach has led to significant advancements in high-speed testing methods.

Latest Patents

Dal-jo Lee holds a patent for a high-speed disturb testing method and word line decoder in semiconductor devices. This patent outlines a comprehensive process that includes writing and confirming data in memory cells, applying disturb to word lines, and ensuring the integrity of data throughout the testing phases. The method enhances the reliability and performance of semiconductor memory devices.

Career Highlights

Dal-jo Lee is currently employed at Samsung Electronics Co., Ltd., a leading global technology company. His work at Samsung has positioned him as a key player in the development of advanced semiconductor technologies. His expertise in memory devices has contributed to the company's reputation for innovation and quality.

Collaborations

Dal-jo Lee has collaborated with notable colleagues, including Byung-se So and Jin-ho So. These partnerships have fostered a collaborative environment that encourages the exchange of ideas and expertise in semiconductor research and development.

Conclusion

Dal-jo Lee's contributions to semiconductor technology exemplify the spirit of innovation in the industry. His patent for a high-speed disturb testing method showcases his commitment to enhancing the performance of memory devices. Through his work at Samsung Electronics, he continues to influence the future of semiconductor technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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