Company Filing History:
Years Active: 2010
Title: Daisuke Terauchi: Innovator in Charged Particle Beam Technology
Introduction
Daisuke Terauchi is a prominent inventor based in Hitachinaka, Japan. He is known for his significant contributions to the field of charged particle beam technology. His innovative work has led to the development of advanced equipment that enhances measurement accuracy in various applications.
Latest Patents
Daisuke Terauchi holds a patent for "Charged particle beam equipment with magnification correction." This invention enables the simultaneous measurement and correction of magnification errors in both X and Y directions in one measurement. It does so without requiring the elimination of any displacement in the rotation direction between the periodic structure pattern of a sample and the X or Y direction on an electron image of the sample. The technology utilizes FFT transformation and coordinate transformation to achieve this, even in the presence of rotational displacement.
Career Highlights
Daisuke Terauchi is associated with Hitachi High-Technologies Corporation, where he has made significant strides in research and development. His work has been instrumental in advancing the capabilities of charged particle beam equipment, making it more efficient and reliable for various scientific applications.
Collaborations
Throughout his career, Daisuke has collaborated with notable colleagues, including Masaru Ozawa and Hiromi Inada. These collaborations have fostered an environment of innovation and have contributed to the success of their projects.
Conclusion
Daisuke Terauchi's contributions to charged particle beam technology exemplify the spirit of innovation. His patented equipment represents a significant advancement in the field, showcasing his expertise and dedication to improving measurement techniques.