Tosu, Japan

Daisuke Ogata

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Fujifilm Corporation. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Daisuke Ogata. Retrieved from https://idiyas.com/inventor/daisuke-ogata-r6zwi6b0

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Daisuke Ogata: Innovator in Immunochromatography

Introduction

Daisuke Ogata is a prominent inventor based in Tosu, Japan. He has made significant contributions to the field of immunochromatography, particularly with his innovative methods that enhance the measurement capabilities of samples.

Latest Patents

Daisuke Ogata holds 1 patent for his immunochromatography method. This invention aims to provide a method capable of measuring samples in both low and high concentration ranges. The method involves spreading a test substance along with two labeling substances on an insoluble carrier, allowing for a much wider measurable range compared to conventional methods.

Career Highlights

Ogata is associated with Fujifilm Corporation, where he has been able to apply his expertise in developing advanced diagnostic methods. His work has been instrumental in improving the accuracy and efficiency of immunochromatography techniques.

Collaborations

He has collaborated with notable coworkers such as Takayoshi Oyamada and Junichi Katada, contributing to various projects that enhance the capabilities of their research and development efforts.

Conclusion

Daisuke Ogata's contributions to immunochromatography exemplify the impact of innovative thinking in scientific research. His work continues to influence the field and improve diagnostic methodologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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