This inventor holds 1 USPTO granted patent. Top assignee: Fujfilm Corporation. Active years: 2026.
Company Filing History:
Years Active: 2026
Title: Daisuke Arioka: Innovator in Ultraviolet Inspection Technology
Introduction
Daisuke Arioka is a prominent inventor based in Shizuoka, Japan. He has made significant contributions to the field of ultraviolet inspection technology. His innovative work has led to the development of a unique ultraviolet inspection tool that enhances the capabilities of inspection processes.
Latest Patents
Arioka holds a patent for an ultraviolet inspection tool, ultraviolet inspection kit, and ultraviolet inspection method. This invention provides an ultraviolet inspection tool that exhibits excellent color formability with respect to light having a wavelength of 222 nm, even when the irradiation amount of this light is minimal. The tool includes an ultraviolet-sensing layer containing a color-forming agent and an acid generator. The color-forming agent is selected from various structures, including lactone, lactam, sultone, sultine, and azobenzene structures. The acid generator has a molecular weight of 600 or less, and the mass ratio of the acid generator to the color-forming agent ranges from 1.01 to 40.00. Arioka's patent represents a significant advancement in ultraviolet inspection technology, with 1 patent to his name.
Career Highlights
Daisuke Arioka is currently employed at Fujifilm Corporation, where he continues to innovate and develop new technologies. His work at Fujifilm has allowed him to collaborate with other talented professionals in the field, further enhancing his contributions to ultraviolet inspection technology.
Collaborations
Arioka has worked closely with his coworker, Kimi Ikeda, to advance their research and development efforts. Their collaboration has been instrumental in refining the technologies they work on and bringing innovative solutions to the market.
Conclusion
Daisuke Arioka is a notable inventor whose work in ultraviolet inspection technology has made a significant impact in the field. His innovative patent and ongoing contributions at Fujifilm Corporation highlight his dedication to advancing inspection methodologies.