Henderson, NV, United States of America

Daisha Puccinelli

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Siemens Healthineers International Ag. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Daisha Puccinelli. Retrieved from https://idiyas.com/inventor/daisha-puccinelli

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Daisha Puccinelli and Respiratory Cycle Simulation Technology.

Introduction

Daisha Puccinelli is an inventor based in Henderson, Nevada. His patent work includes technology for treatment delivery systems, with a focus on optical surface monitoring calibration and respiratory cycle simulation. He is associated with Siemens Healthineers International AG.

Latest Patents

Puccinelli is named on 1 patent, titled “Apparatus for Optical Surface Monitoring Calibration and Respiratory Cycle Simulation.” The invention describes an apparatus with a base designed to rest on a treatment couch and a movable surface that can be actuated toward or away from the couch. This movement can support calibration and simulation tasks in treatment delivery systems.

Career Highlights

The available information identifies Puccinelli’s patent activity in medical treatment technology and his association with Siemens Healthineers International AG. His patented apparatus addresses equipment used in treatment settings.

Collaborations

Puccinelli’s listed coworkers include Ruth Connolly and Candice Brunscheen. The provided information does not specify their roles in the patent or their particular contributions.

Conclusion

Daisha Puccinelli’s patent concerns a movable-surface apparatus for treatment delivery systems, reflecting his work in medical technology innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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