Allentown, PA, United States of America

Dahua Qin

This inventor holds 13 USPTO granted patents and 3 published patent applications. Top assignees: Lsi Corporation, Avago Technologies General IP (Singapore) Pte. Ltd.. Active years: 2013-2016.

USPTO Granted Patents = 13 

% Patents Active = 92.3

Average Co-Inventor Count = 3.2

ph-index = 3

Forward Citations = 55(Granted Patents)


Company Filing History:


Years Active: 2013-2016

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13 patents (USPTO):Explore Patents

Title: Dahua Qin: Innovator in Pattern Detection and Media Flaw Detection

Introduction

Dahua Qin is a prominent inventor based in Allentown, PA (US), known for his significant contributions to the fields of pattern detection and media flaw detection. With a total of 13 patents to his name, he has made remarkable advancements that enhance the efficiency and accuracy of data processing.

Latest Patents

Among his latest patents, one notable invention is titled "Methods and apparatus for improved pattern detection." This innovation provides improved pattern detection for predefined patterns in data. The detection threshold employed by a Euclidean detector can be adjusted based on data gathered that corresponds to an indication of a detected pattern by one of a plurality of pattern detectors. Another significant patent is "Systems and methods for detecting media flaws." This apparatus includes a branch metric selection circuit that selects a first and second branch metric, a subtraction circuit that subtracts the second branch metric from the first, and a comparator that indicates the presence of a potential flaw in a storage medium when the difference is less than a threshold value.

Career Highlights

Dahua Qin has worked with several notable companies throughout his career, including LSI Corporation and Avago Technologies General IP (Singapore) Pte. Ltd. His work in these organizations has contributed to the development of innovative technologies that address complex challenges in data processing and storage.

Collaborations

Dahua has collaborated with talented individuals in his field, including Haitao Xia and Xun Zhang. These collaborations have fostered an environment of innovation and creativity, leading to the development of groundbreaking technologies.

Conclusion

Dahua Qin's contributions to pattern detection and media flaw detection have established him as a leading inventor in his field. His innovative patents and collaborations reflect his commitment to advancing technology and improving data processing methods.

Profile summary based on public USPTO records.
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