Dahua Qin

This inventor holds 13 USPTO granted patents and 3 published patent applications, primarily in Servo Technology. Top assignees: Lsi Corporation, Avago Technologies General IP (Singapore) Pte. Ltd.. Active years: 2013-2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dahua Qin. Retrieved from https://idiyas.com/inventor/dahua-qin

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

USPTO Granted Patents = 13 (Patent Applications = 3)

% Patents Active = 92.3

Average Co-Inventor Count = 3.2

ph-index = 3

Forward Citations = 55(Granted Patents)

Company Filing History:

Avago Technologies General IP (Singapore) Pte. Ltd.

patents

Years Active: 2013-2016

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Areas of Expertise:

Pattern Detection

Media Flaws

Signal To Noise Ratio

Servo Format

Phase Estimation

Gain Recovery

Burst Demodulation

Target Adaptation

Address Mark Detection

Multi-Zone Processing

Sync Mark Detection

13 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 9401166 - Methods and apparatus for improved pattern detection (2016-07-26),

2. 9244752 - Systems and methods for detecting media flaws (2016-01-26),

3. 8995072 - Servo system with signal to noise ratio marginalization (2015-03-31),

4. 8970981 - Hardware support of servo format with two preamble fields (2015-03-03),

5. 8958166 - Method and system for sliding-window based phase, gain, frequency and DC offset estimation for servo channel (2015-02-17),

6. 8929017 - Systems and methods for SNR measurement using equalized data (2015-01-06),

7. 8861107 - Systems and methods for burst demodulation (2014-10-14),

8. 8773811 - Systems and methods for zone servo timing gain recovery (2014-07-08),

9. 8767333 - Systems and methods for pattern dependent target adaptation (2014-07-01),

10. 8755138 - Adaptive servo address mark detection (2014-06-17),

11. 8681444 - Multi-zone servo processor (2014-03-25),

12. 8625216 - Servo zone detector (2014-01-07),

13. 8614858 - Systems and methods for sync mark detection metric computation (2013-12-24),

Title: Dahua Qin: Innovator in Pattern Detection and Media Flaw Detection

Introduction

Dahua Qin is a prominent inventor based in Allentown, PA (US), known for his significant contributions to the fields of pattern detection and media flaw detection. With a total of 13 patents to his name, he has made remarkable advancements that enhance the efficiency and accuracy of data processing.

Latest Patents

Among his latest patents, one notable invention is titled "Methods and apparatus for improved pattern detection." This innovation provides improved pattern detection for predefined patterns in data. The detection threshold employed by a Euclidean detector can be adjusted based on data gathered that corresponds to an indication of a detected pattern by one of a plurality of pattern detectors. Another significant patent is "Systems and methods for detecting media flaws." This apparatus includes a branch metric selection circuit that selects a first and second branch metric, a subtraction circuit that subtracts the second branch metric from the first, and a comparator that indicates the presence of a potential flaw in a storage medium when the difference is less than a threshold value.

Career Highlights

Dahua Qin has worked with several notable companies throughout his career, including LSI Corporation and Avago Technologies General IP (Singapore) Pte. Ltd. His work in these organizations has contributed to the development of innovative technologies that address complex challenges in data processing and storage.

Collaborations

Dahua has collaborated with talented individuals in his field, including Haitao Xia and Xun Zhang. These collaborations have fostered an environment of innovation and creativity, leading to the development of groundbreaking technologies.

Conclusion

Dahua Qin's contributions to pattern detection and media flaw detection have established him as a leading inventor in his field. His innovative patents and collaborations reflect his commitment to advancing technology and improving data processing methods.

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

3 patents pending: